Samsung Develops 3D Memory Package that Greatly Improves Performance Using Less Space

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April 14th, 2006 Leave a comment Visited 20 times, 1 so far today

Samsung Develops 3D Memory Package that Greatly Improves Performance Using Less Space

Samsung Electronics Co., Ltd., the world leader in advanced memory technology, announced today that it has developed a small-footprint, wafer-level processed stack package (WSP) of high density memory chips using ‘through silicon via’ (TSV) interconnection technology. WSP actually reduces the physical size of a stacked set of semiconductor chips, while greatly improving overall performance. Widely seen as the next generation in package technologies, WSP can be applied to all types of hybrid packages, including memory and processors, to deliver higher speed and higher density with minimum use of chip space.

Using this technology, mobile device and consumer electronics manufacturers will gain better electrical performance, well suited for slimmer, high-performance handset designs that provide longer battery time. Samsung’ industry-first WSP is a 16Gbit memory solution that stacks eight 2Gb NAND chips. The WSP generates a much smaller multi-chip package (MCP), which is the current mainstream solution for designing miniaturized, high-capacity memory devices. Samsung’s eight-chip WSP prototype sample, which vertically stacks eight 50㎛ (micrometers), 2Gb NAND flash die, is 0.56 millimeters in height.

The chips in today’s MCPs are connected by wire bonding, which requires vertical gaps between dies that are tens of microns wide and horizontal spaces on the package board that are hundreds of microns wide to accommodate the wire connections. By contrast, WSP forms micron-sized holes that penetrate through the silicon vertically to connect circuits directly, eliminating the need for gaps of extra space and wires protruding beyond the sides of the die. Due to these advantages, WSP has a 15-percent smaller footprint and is 30 percent thinner than an equivalent wire-bonded MCP solution.

Read the complete Press Release





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