New Radiation-hardened Detectors Provide High-Speed Real-time Industrial Inspection; Showcasing at 17th World Conference on Nondestructive Testing in Shanghai, China
World Conference on Nondestructive Testing
Booth C310
Western Hall #1
PerkinElmer Optoelectronics, a global technology leader in digital imaging, specialty lighting and optical detection technologies, today announced it will showcase its new high-speed, high-throughput, digital x-ray detectors at the 17th [...]